Service of Wafer/IC Testing
Offering turnkey service of testing development and mass production management, including wafer (CP) and IC (FT) test program development, test fixtures design, and production management. LYG testing is supported by experienced technical professionals with development experience in various product types, providing complete and reasonable testing solutions.
Testing Solution
Testing Development
- Plan chip testability with a focus on testing during chip design phase, achieving optimal testing cost.
- Develop and verify testing during the silicon validation phase to strive for the shortest time to market.
- For automotive chips, control testing development and mass production in accordance with automotive specifications.
ATE Platform
- In accordance with the characteristics of customer products, LYG provide planning and development for ATE platforms such as V93K, UltraFLEX, J750, Chroma 3650, STS8200, CAT8280, and others. This is to meet the customer requirements of quality, cost, and efficiency.
- Provide conversion between different ATE platforms to meet the customer's optimal mass production requirements.
ATE Resources
- According to the product specifications, match appropriate ATE resources to assist customers in achieving reasonable mass production costs.
Test Fixtures
- Provide design and production management for probe cards, load boards, burn-in boards, sockets, and change kits.
Test Program Development
- Support the WGL, STIL, TSTL2 pattern format conversion
- Support the pattern format conversion between ATE platforms
- Develop the communication port format such as IIC、UART、JTAG、SWD in test program
- Develop test program with customized format of communication port
- Develop test program for OTP(One Time Programing)
Characteristics Analysis
- Characteristics analysis based on product design specifications and test plans.
- Develop specialized test programs for product characteristics analysis
- Collect and analyze the characteristic data for yield improvement
Key testers
